News & Events

Bruker’s new Contour LS-K 3D Optical Profiler utilizes LightSpeed™ focus variation technology to uniquely enable both high-resolution images and quantifiable data.

NanoElectrical Lab - Multidimensional nanoscale information at every pixel. The new NanoElectrical Lab™ is an expansion from conventional contact-based electrical modes to innovative capabilities.

AcuityXR - Enhances Lateral Resolution of 3D Optical Surface Profilers, break the optical diffraction limit and deliver lateral resolutions previously considered unattainable with conventional optical microscopy techniques.

UMT TriboLab™ - Brake Material Screening achieve cost-effective development of friction materials, performs benchtop testing on small samples, applying comparable contact pressures to full-scale dynamometer testing.

PeakForce SECM™ the world’s first complete commercial solution for AFM-based scanning electrochemical microscopy (SECM).

Bioscope Resolve - Unrivalled BioAFM for Biomechanics and Highest Resolution Imaging Providing new insights into mechanobiology research

Inspire - AFM-Based IR Nanocharacterization System Providing highest resolution nanochemical and properties mapping

Dimension Edge-PSS - 3D Metrology & Process Control for PSS, AutoMET automated metrology and production capabilities with AFM 3D resolution

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